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Assessment of the Quality of Raw Measurement From SAMSUNG SOC GNSS Chip and Analysis of Positioning Accuracy Using PPP
Bogeun Cho
,
Bu-gyeom Kim
,
Jong-Heon Kim
,
Changdon Kee
,
Sunkyoung Yu
,
O-Jong Kim
,
Jungbeom Kim
January 2021
Type
Article-Conference
Publication
International Technical Meeting / Precise Time and Time Interval Systems and Application meeting (ITM/PTTI 2021)
Bogeun Cho
M.S
Bu-gyeom Kim
Ph.D
Jong-Heon Kim
M.S
Changdon Kee
Professor
Sunkyoung Yu
Ph.D
O-Jong Kim
Ph.D
Jungbeom Kim
Ph.D
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